Abstract

The U.S. Department of Agriculture has proposed to develop Ii new high speed, high volume technique to assess cotton quality. This goal has led us to investigate the feasibility of near infrared reflectance spectroscopy as a technique for evaluating cotton fiber perimeter size and wall thickness, two of the physical characteristics used in the evaluation of cotton fineness and maturity.

In order to isolate the effects of perimeter size and wall thickness, nineteen cotton samples were selected on the basis of their having a nonsignificant correlation between these 2 measurements. The reflectance spectra from 1100 to 2500 nanometers was recorded at every other wavelength. The 700 independent variables were transformed by log (1/ reflectance). Due to the multicollinearity of the independent variables, the principle components were used in a multiple regression with data obtained from the reference method (arealometer) for the two dependent variables, perimeter size and wall thickness. The regression analysis of perimeter size and wall thickness on the principle components gave R2'S of 0.229 and 0.943 respectively.

Keywords

Cotton fineness, Cotton maturity. Near-infrared reflectance, Principalcomponents.

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Creative Commons Attribution-Noncommercial-No Derivative Works 4.0 License
This work is licensed under a Creative Commons Attribution-Noncommercial-No Derivative Works 4.0 License.

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Apr 30th, 11:00 AM

THE USE OF NEAR INFRARED REFLECTANCE FOR EVALUATING COTTON FINENESS AND MATURITY

The U.S. Department of Agriculture has proposed to develop Ii new high speed, high volume technique to assess cotton quality. This goal has led us to investigate the feasibility of near infrared reflectance spectroscopy as a technique for evaluating cotton fiber perimeter size and wall thickness, two of the physical characteristics used in the evaluation of cotton fineness and maturity.

In order to isolate the effects of perimeter size and wall thickness, nineteen cotton samples were selected on the basis of their having a nonsignificant correlation between these 2 measurements. The reflectance spectra from 1100 to 2500 nanometers was recorded at every other wavelength. The 700 independent variables were transformed by log (1/ reflectance). Due to the multicollinearity of the independent variables, the principle components were used in a multiple regression with data obtained from the reference method (arealometer) for the two dependent variables, perimeter size and wall thickness. The regression analysis of perimeter size and wall thickness on the principle components gave R2'S of 0.229 and 0.943 respectively.